Finfet structure and method for manufacturing thereof

ABSTRACT

Present disclosure provides a FinFET structure, including a plurality of fins, a gate, and a first dopant layer. The gate is disposed substantially orthogonal over the plurality of fins, covering a portion of a top surface and a portion of sidewalls of the plurality of fins. The first dopant layer covers the top surface and the sidewalls of a junction portion of a first fin, configured to provide dopants of a first conductive type to the junction portion of the first fin. The junction portion is adjacent to the gate.

BACKGROUND

The semiconductor integrated circuit (IC) industry has experiencedexponential growth. Technological advances in IC materials and designhave produced generations of ICs where each generation has smaller andmore complex circuits than the previous generation. In the course of ICevolution, functional density (i.e., the number of interconnecteddevices per chip area) has generally increased while geometry size(i.e., the smallest component (or line) that can be created using afabrication process) has decreased. This scaling down process generallyprovides benefits by increasing production efficiency and loweringassociated costs.

Such scaling down has also increased the complexity of processing andmanufacturing ICs and, for these advances to be realized, similardevelopments in IC processing and manufacturing are needed. For example,a three dimensional transistor, such as a fin-like field-effecttransistor (FinFET), has been introduced to replace a planar transistor.The fin transistor has a channel (referred to as a fin channel)associated with a top surface and opposite sidewalls. The fin channelhas a total channel width defined by the top surface and the oppositesidewalls. Although existing FinFET devices and methods of fabricatingFinFET devices have been generally adequate for their intended purposes,they have not been entirely satisfactory in all respects. For example, avariation of fin width and profile, especially at an end of the fin,raises challenges in a FinFET process development. It is desired to haveimprovements in this area.

BRIEF DESCRIPTION OF THE DRAWINGS

Aspects of the present disclosure are best understood from the followingdetailed description when read with the accompanying figures. It isnoted that, in accordance with the standard practice in the industry,various features are not drawn to scale. In fact, the dimensions of thevarious features may be arbitrarily increased or reduced for clarity ofdiscussion.

FIG. 1 shows a perspective view of a FinFET structure, in accordancewith some embodiments of the present disclosure.

FIG. 2 shows a cross sectional view along line AA of the FinFETstructure shown in FIG. 1, in accordance with some embodiments of thepresent disclosure.

FIG. 3 shows a cross sectional view along line AA of the FinFETstructure shown in FIG. 1, in accordance with some embodiments of thepresent disclosure.

FIG. 4 shows a cross sectional view of a junction portion of a FinFETstructure, in accordance with some embodiments of the presentdisclosure.

FIG. 5 shows a cross sectional view of a junction portion of a FinFETstructure, in accordance with some embodiments of the presentdisclosure.

FIG. 6 shows a cross sectional view of a FinFET structure along line BBas shown in FIG. 1 and line CC as shown in FIG. 5, in accordance withsome embodiments of the present disclosure.

FIG. 7 shows a cross sectional view of a FinFET structure along line BBas shown in FIG. 1 and line DD as shown in FIG. 5, in accordance withsome embodiments of the present disclosure.

FIG. 8 shows a cross sectional view of a junction portion of a FinFETstructure, in accordance with some embodiments of the presentdisclosure.

FIG. 9 shows a cross sectional view of a junction portion of a FinFETstructure, in accordance with some embodiments of the presentdisclosure.

FIG. 10 shows a cross sectional view of a FinFET structure along line BBas shown in FIG. 1 and line EE as shown in FIG. 9, in accordance withsome embodiments of the present disclosure.

FIG. 11 shows a cross sectional view of a FinFET structure along line BBas shown in FIG. 1 and line FF as shown in FIG. 9, in accordance withsome embodiments of the present disclosure.

FIG. 12 to FIG. 18 show fragmental cross sectional views along line AAof FIG. 1, regarding a manufacturing method for a FinFET structure, inaccordance with some embodiments of the present disclosure.

FIG. 19 to FIG. 22 show fragmental cross sectional views along line AAof FIG. 1, regarding a manufacturing method for a FinFET structure, inaccordance with some embodiments of the present disclosure.

FIG. 23 to FIG. 29 show fragmental cross sectional views along line BBof FIG. 1, regarding a manufacturing method for a FinFET structure, inaccordance with some embodiments of the present disclosure.

DETAILED DESCRIPTION

The following disclosure provides many different embodiments, orexamples, for implementing different features of the provided subjectmatter. Specific examples of components and arrangements are describedbelow to simplify the present disclosure. These are, of course, merelyexamples and are not intended to be limiting. For example, the formationof a first feature over or on a second feature in the description thatfollows may include embodiments in which the first and second featuresare formed in direct contact, and may also include embodiments in whichadditional features may be formed between the first and second features,such that the first and second features may not be in direct contact. Inaddition, the present disclosure may repeat reference numerals and/orletters in the various examples. This repetition is for the purpose ofsimplicity and clarity and does not in itself dictate a relationshipbetween the various embodiments and/or configurations discussed.

Further, spatially relative terms, such as “beneath,” “below,” “lower,”“above,” “upper” and the like, may be used herein for ease ofdescription to describe one element or feature's relationship to anotherelement(s) or feature(s) as illustrated in the figures. The spatiallyrelative terms are intended to encompass different orientations of thedevice in use or operation in addition to the orientation depicted inthe figures. The apparatus may be otherwise oriented (rotated 90 degreesor at other orientations) and the spatially relative descriptors usedherein may likewise be interpreted accordingly.

In a semiconductor FinFET structure, a lightly-doped drain (LDD) regionis formed in a vicinity of a boundary between a gate and a drain regionor a source region. Implant dopants such as arsenic or phosphorous areutilized in lightly-doped drain (LDD) formation prior to recessformation on the fin. During an LDD implantation of an n-type fin,p-type fins adjacently disposed are covered by photoresist block inorder to prevent the n-type dopant from bombarding the p-type fin. TheLDD implant formed within the respective n-type fin is fundamentallylimited by a height of said photoresist block, causing an implantshadowing effect wherein a first implant angle is constrained by theheight of the photoresist block. In addition, a separation between twoadjacent n-type fins, for example, a pitch of the n-type fin, determinesa second implant angle shadowing certain regions of the n-type fin frombeing implanted. The first implant angle and the second implant anglecan be approximately 10 degrees or less. As a result, a non-uniform LDDtop to bottom dopant distribution caused by the implant shadowing effectcan be observed. For example, a bottom of a respective fin LDD regionreceives approximately 30% or less dopant concentration than top finLDD.

To be more specific, dopant concentration at a top surface, a firstsidewall, and a second sidewall opposing the first sidewall of the finwith a desired dopant type (e.g. n-type) can be dramatically different.For example, the top surface of the fin may receive a highest amount ofdopants while the bottom sidewall of the fin may receive a considerablelower dopant than the top counterpart. Moreover, a first sidewall mayreceive more dopants than the second sidewall opposite thereto becausethe environment in proximity to the first sidewall and the secondsidewall are different. For instance, a photoresist block covering a finof an opposite conductive type can be disposed immediately adjacent tothe first sidewall, while an exposed fin can be disposed adjacent to thesecond sidewall. The shadowing effect with respect to the first and thesecond sidewall are thus different. Consequently, dopant concentrationat the top surface, the first sidewall, and the second sidewall can besubstantially different after the implantation. Even the annealingoperation is followed in order to activate and redistribute the dopants,effect are limited to some extent.

Solutions such as increasing the implantation energy is proposed tosolve the non-uniform distribution of the dopants in the LDD region of afin. However, not only the vertical range of the dopant but also thelateral range of the dopant may be extended at the increase of theimplantation energy. Because the LDD region is in proximity to a channelregion, the lateral encroachment of the dopant can substantially createscattering centers in the channel region, and hence deteriorate theperformance of the transistor device. The uniformity of the dopantconcentration at the top surface, the first sidewall, and the secondsidewall of a fin is crucial for I_(on) performance of the device. It isunderstood that current density are concentration at the surface of achannel region where the fin is in contact with the wrapped gate. Finsurface at the LDD region lacking sufficient dopants forms bottlenecksfor the current to flow through the channel. Therefore, forming the LDDregion on a fin with uniform dopant distribution at the top surface, thefirst sidewall, and the second sidewall opposite to the first sidewallis critical to improve device performance.

Present disclosure provides a FinFET structure that is able to formuniform dopant distribution along the top surface, the first sidewall,and the second sidewall of the fin at an LDD region.

Present disclosure also provides a method for forming a FinFET structurethat is able to form uniform dopant distribution along the top surface,the first sidewall, and the second sidewall of the fin at an LDD region.

Referring to FIG. 1, FIG. 1 is a perspective view of a FinFET structure10. The FinFET structure 10 only shows the portion above an insulatinglayer, for example, shallow trench isolation (STI). In some embodiments,semiconductor fins 101 and 103 are n-type fins, the bottom of whichextends into the insulating layer (not shown in FIG. 1). The FinFETstructure 10 further includes a gate 105 disposed substantiallyorthogonal over the fins 101 and 103. However, the orthogonality betweenthe fins and the gate is not a requirement to carry out the FinFETstructure described herein. Other arrangements such as oblique orstaggered are within the contemplated scope of the present disclosure.The fins 101 and 103 penetrate through the sidewalls 1051 and 1053 ofthe gate 105 along a longitudinal direction of the fin. The gate 105thus covers a portion of a top surface and a portion of sidewalls of thefins 103 and 105. For clarity purpose, the portion of the fins coveredby the gate 105 is not shown in FIG. 1. In some embodiments, the portionof the fins covered by the gate 105 is called the channel portion of thefin 103.

Still referring to FIG. 1, a junction portion 107 of the fins 103 and105 can be identified as a region of the fin in proximity to the gate105. In some embodiments, the junction portion 107 can be an LDD regionor a Halo region of the fin. Referring to fin 103, a first dopant layer109 is covered on a top surface 103A and sidewalls 103B of the fin 103.The first dopant layer 109 may include n-type dopant such as phosphorousand in configured to provide the n-type dopant to the region of the fincovered by said first dopant layer 109. In some embodiments, the firstdopant layer 109 may include phosphosilicate glass (PSG) orphosphor-doped oxides. The junction region 107 in FIG. 1 is adjacent tothe sidewall 1051 of the gate 105. On the opposite side of the gate 105,another first dopant layer (not shown) is also formed adjacent to thesidewall 1053 of the gate 105, covering the top surface 103A and thesidewalls 103B of the fin 103.

Still referring to FIG. 1, a sidewall spacer 104 is disposed at bothsidewalls 1051, 1053 of the gate 105. For the purpose of clarity, thesidewall spacer 104 is depicted in a perspective view, such that thejunction region 107 and the first dopant layer 109 covered under thespacer 104 can be viewed. In other embodiments, the first dopant layer109 may not be completely covered under the spacer 104.

Referring to FIG. 2, FIG. 2 is a cross sectional view along line AA ofthe FinFET structure shown in FIG. 1. In FIG. 1, a cross sectiondissected along line AA exposes the junction portion 107 of the fin 103,the first dopant layer 109, and the sidewall spacer 104 surroundingthereof. FIG. 2 further shows a portion below a surface of theinsulating layer 200′ such as an STI. As shown in FIG. 2, the fins 101and 103 include a portion extruding from the insulating layer 200′ and aportion surrounded by the insulating layer 200′. Only the portionextruding from the insulating layer 200′ is covered by the first dopantlayer 109. In some embodiments, the portion of the fin 101 extrudingfrom the insulating layer 200′ has a height of from about 30 nm to about50 nm. The portion of the fin 101 surrounded by the insulating layer 200has a height of from about 60 nm to about 80 nm. The first dopant layer109 covering the top surface 101A and the sidewalls 101B of the fin 101can have a thickness T1 in a range of from about 2 nm to about 8 nm. AFinFET structure having a first dopant layer arranged as shown in FIG. 2demonstrates a uniform dopant distribution at region approximate to thetop surface 101A and to the sidewalls 101B of the fin 101. For example,dopant concentrations at the top region 1011 and the sidewall region1013 are substantially identical. Alternatively stated, a dopantconcentration difference between the top region 1011 and the sidewallregion 1013 is below about 5%.

In some embodiments, a two-dimensional dopant concentration mapping canbe measured by Scanning Spreading Resistance Microscopy (SSRM). SSRMprovides a wide range resistance mapping and high spatial resolutioncarrier density profiling. By using SSRM as a means for measurement,dopant concentration distribution in the fins 101 and 103 can be mappedand the dopant concentration at the top region 1011 and the sidewallregion 1013 can be compared.

Referring to FIG. 3, FIG. 3 is a cross sectional view along line AA ofthe FinFET structure shown in FIG. 1. In addition to a first dopantlayer 109, a capping layer 129 is further disposed thereover. In someembodiments, the thickness T2 of the capping layer 129 is in a range offrom about 5 nm to about 10 nm. In some embodiments, the capping layer129 and the sidewall spacer 104 can be made of the same materials suchas SiN or they can be made of different materials, so that the cappinglayer 129 is distinguishable from the sidewall spacer 104. Compared to aconventional FinFET structure where no first dopant layer 109 isdisposed over the junction region 107 of the fin 103, dopantconcentration at the top region 1011 and the sidewall bottom region 1015of the present disclosure are substantially identical, even before anannealing operation. In a case where no dopant layer is applied, areduced amount of implant reaches sidewall bottom 1015 due to implantshadowing effect, and hence the dopant concentration between the topregion 1011 and the sidewall bottom region 1015 differs substantiallyeven after a post-implant anneal.

Referring to FIG. 4, FIG. 4 shows a cross sectional view of a junctionportion of a FinFET structure, in accordance with some embodiments ofthe present disclosure. The junction portions of four fins are shown inthe cross section of FIG. 4. Fins 101 and 103 are referred to the “firstfin” 100 or the “first set of fins”. Fins 201 and 203 are referred tothe “second fin” 200 or the “second set of fins”. In some embodiments,the first fin 100 and the second fin 200 are different in the conductivetype. For example, first fin 100 is an n-type fin while the second fin200 is a p-type fin. As shown in FIG. 4, a first dopant layer 109 isformed directly in contact with the first fin 100, whereas a diffusionbarrier 119 is formed directly in contact with the second fin 200,separating the second fin 200 and the first dopant layer 109.Alternatively stated, a single layer is formed over the first fin 100,and a bi-layer is formed over the second fin 200. In some embodiments,the bi-layer includes a first dopant layer 109 and a diffusion barrier119. A thickness of the first dopant layer 109 is in a range of fromabout 1 nm to about 8 nm. The diffusion barrier 119 shall be thickenough to prevent the n-type dopants in the first dopant layer 109 frombeing diffused into the second fin 200. In some embodiments, a thicknessof the diffusion barrier 119 is between about 5 nm to about 10 nm.

Referring to FIG. 5, FIG. 5 shows a cross sectional view of a junctionportion of a FinFET structure, in accordance with some embodiments ofthe present disclosure. A difference between FIG. 4 and FIG. 5 is that acapping layer 129 is further disposed over the first dopant layer 109 ofthe first fin 100 and the first dopant layer 109 of the second fin 200.In some embodiments, the capping layer 129 and the diffusion barrier 119are made of identical material. In other embodiments, the capping layer129 and the diffusion barrier 119 are not made of identical material. Insome embodiments, the thickness of the capping layer 129 and that of thediffusion barrier 119 are substantially identical. The capping layer 129shown in FIG. 5 is to provide a stable seal to the first dopant layer109 under high-temperature annealing operation as is discussed later inthe present disclosure.

Referring to FIG. 6, FIG. 6 shows a cross sectional view of a FinFETstructure along line BB of FIG. 1 and along line CC of FIG. 5, inaccordance with some embodiments of the present disclosure. The gate 105and the sidewall spacer 104 are positioned on over the first fin 103.Dotted lines shown in FIG. 6 refer to the hidden contour of the gate 105and sidewall spacer 104 across the first fin 103. The first dopant layer109 and the capping layer 129 are disposed over the first fin 103,abutting sidewalls 1051 and 1053 of the gate 105. As shown in FIG. 6, aregrown source 301 and regrown drain 303 are formed partially in thefirst fin 103. In some embodiments, a widest portion of the regrownregion is encroached under the sidewall spacer 104. In otherembodiments, the widest portion of the regrown region is in contact withthe tri-layer formed over the lightly doped region or LDD at thejunction portion 107 of the first fin 103.

Referring to FIG. 7, FIG. 7 shows a cross sectional view of a FinFETstructure along line BB of FIG. 1 and along line DD of FIG. 5, inaccordance with some embodiments of the present disclosure. The gate 105and the sidewall spacer 104 are positioned on over the second fin 201.Dotted lines shown in FIG. 7 refer to the hidden contour of the gate 105and sidewall spacer 104 across the second fin 201. The barrier layer119, the first dopant layer 109, and the capping layer 129 are disposedover the second fin 201, abutting sidewalls 1051 and 1053 of the gate105. As shown in FIG. 7, a regrown source 301 and regrown drain 303 areformed partially in the second fin 201. In some embodiments, a widestportion of the regrown region is encroached under the sidewall spacer104. In other embodiments, the widest portion of the regrown region isin contact with the tri-layer formed over the lightly doped region orLDD at the junction portion 107 of the second fin 201.

Referring to FIG. 8, FIG. 8 shows a cross sectional view of a junctionportion of a FinFET structure, in accordance with some embodiments ofthe present disclosure. As shown in FIG. 8, a second dopant layer 209 isformed directly in contact with the second fin 200, whereas a firstdopant layer 109 is formed directly in contact with the first fin 100.In some embodiments, the second dopant layer 209 includes dopants of anopposite type to that of the first dopant layer 109. For example, thesecond dopant layer 209 includes borosilicate glass (BSG) or boron-dopedsilicon oxides. The second dopant layer 209 covers a top surface 201Aand sidewalls 201B of the second fin 200. The second dopant layer 209directly contact the second fin 200 in order to allow the second dopantscontained therein to diffuse into the second fin 200.

Still referring to FIG. 8, the capping layer 129 and a second dopantlayer 209 are further sequentially disposed over the first dopant layer109 over the first fin 100. Alternatively stated, a triple layer isformed over the first fin 100, and a single layer is formed over thesecond fin 200. A thickness of the second dopant layer 209 is in a rangeof from about 1 nm to about 8 nm, similar to the thickness of the firstdopant layer 209. As shown in FIG. 8, according to a SSRM measurement,second dopant concentration at a top region 2011 and at a bottomsidewall 2015 of the second fin 200 are substantially the same. In otherwords, a difference between the second dopant concentration at a topregion 2011 and at a sidewall 2013 of the second fin 200 is below about5%. Similarly, the first dopant concentration at a top region 1011 andthat at a bottom sidewall 1015 of the first fin 100 are substantiallythe same. In other words, a difference between the first dopantconcentration at a top region 1011 and at a sidewall 1013 of the firstfin 100 is below about 5%.

Referring to FIG. 9, FIG. 9 shows a cross sectional view of a junctionportion of a FinFET structure, in accordance with some embodiments ofthe present disclosure. A difference between FIG. 8 and FIG. 9 is that acapping layer 219 is further disposed over the second dopant layer 209of the first fin 100 and the second dopant layer 209 of the second fin200. The capping layer 219 shown in FIG. 9 is to provide a stable sealto the second dopant layer 209 under high-temperature annealingoperation as is discussed later in the present disclosure.

Referring to FIG. 10, FIG. 10 shows a cross sectional view of a FinFETstructure along line BB of FIG. 1 and along line EE of FIG. 9, inaccordance with some embodiments of the present disclosure. The gate 105and the sidewall spacer 104 are positioned on over the first fin 103.Dotted lines shown in FIG. 10 refer to the hidden contour of the gate105 and sidewall spacer 104 across the first fin 103. The first dopantlayer 109, the capping layer 129, the second dopant layer 209, and thecapping layer 229 are sequentially disposed over the first fin 103,abutting sidewalls 1051 and 1053 of the gate 105.

Referring to FIG. 11, FIG. 11 shows a cross sectional view of a FinFETstructure along line BB of FIG. 1 and along line FF of FIG. 9, inaccordance with some embodiments of the present disclosure. The gate 105and the sidewall spacer 104 are positioned on over the second fin 201.Dotted lines shown in FIG. 11 refer to the hidden contour of the gate105 and sidewall spacer 104 across the first fin 103. The second dopantlayer 209 and the capping layer 219 are sequentially disposed over thesecond fin 201, abutting sidewalls 1051 and 1053 of the gate 105. Asshown in FIG. 11, a regrown source 301 and regrown drain 303 are formedpartially in the second fin 201. In some embodiments, a widest portionof the regrown region is encroached under the sidewall spacer 104. Inother embodiments, the widest portion of the regrown region is incontact with the tri-layer formed over the lightly doped region or LDDat the junction portion 107 of the second fin 201.

FIG. 12 to FIG. 18 show fragmental cross sectional views along line AAof FIG. 1, illustrating operations of a manufacturing method for aFinFET structure, in accordance with some embodiments of the presentdisclosure. In FIG. 12, several semiconductor fins 101, 103, 201, 203are formed using photolithography and etching technique known in theart, followed by depositing an insulating layer 200′ and etch back saidinsulating layer 200′ to a predetermined height to expose a portion ofthe semiconductor fins. In some embodiments, a ratio of a height H1extruding from the insulating layer 200′ and a height H2 surrounded bythe insulating layer 200′ is in a range of from about 0.3 to about 1.Fins 101 and 103 are denoted as “first set of fins” 100. Fins 201 and203 are denoted as “second set of fins” 200 in the present disclosure.The first set of fins 100 and the second set of fins 200 may possessdopants of different conductive types.

Referring to FIG. 13 and FIG. 14, a diffusion barrier 119 is formed overa top surface 201A and sidewalls 201B of the second set of fins 200. InFIG. 13, a blanket deposition of a diffusion barrier 119 is conducted tocover all fins, followed by a photolithograph and etching operations toremove the portion of the diffusion barrier 119 disposed over the firstset of fins 100, as shown in FIG. 14. The patterned masking layer 1400can be photoresist. In some embodiments, the diffusion barrier 119 canbe a SiN layer with a thickness of from about 3 nm to about 8 nm.H₃PO₄-based chemistry can be used to remove the SiN layer. In someembodiments, a bottom anti-reflection coating (BARC) is depositedcomformally over the diffusion barrier 119 before the formation of themasking layer 1400. In some embodiments, an oxide layer (not shown) isdeposited over the fins before the deposition of the diffusion barrier119, for example, in the I/O region of a semiconductor chip. Therefore,an additional operation is conducted to remove the oxide layer and untilthe first set of fins 100 is exposed.

Referring to FIG. 15, after the removal of the masking layer 1400 inFIG. 14, a first dopant layer 109 containing dopants of a first type,for example, n-type dopants such as phosphor or arsenic, is conformallydeposited over all fins. In some embodiments, atomic layer deposition(ALD) is adopted to deposit the first dopant layer 109. ALD is used inthe operation to achieve atomic level thickness control of the layerdeposited. In some embodiments, a plasma-enhanced ALD (PEALD) is used todeposit a PSG layer with a thickness of from about 2 nm to about 8 nm.The PSG layer may contain a first dopant concentration greater than orabout 1E22/cm³. In addition, PEALD can be used to form a graded firstdopant layer 109, in which the first dopant concentration is greater inproximity to the fin and gradually decreases as the position moves awayfrom the fin. In FIG. 15, the first dopant layer 109 is in directcontact with the top surface 103A and sidewalls 103B of the first set offins 100 but is separated from the second set of fins 200 by thediffusion barrier 119.

Referring to FIG. 16, a capping layer 129 can be optionally depositedover the first dopant layer 109 previously deposited over the first setof fins 100. In some embodiments, the capping layer 129 can be depositedby ALD or PEALD for a thickness of from about 8 nm to about 12 nm. Insome embodiments, the capping layer 129 includes an offset sidewalldeposition and a dummy sidewall deposition. Referring to FIG. 15 andFIG. 16, the ALD operation of the first dopant layer 109 and the cappinglayer 109 can be conducted in a single operation. In some embodiments,the capping layer contains nitride materials.

Referring to FIG. 17, an annealing operation is carried out to diffusethe dopants from the first dopant layer 109 to the first set of fins100. In some embodiments, the annealing operation includes a spikeanneal under a temperature of from about 950 degrees Celsius to about1050 degrees Celsius at a duration of from about 1.5 to 10 seconds. Asshown in FIG. 17, dopants in the first dopant layer 109 positioned overthe second set of fins 200 is blocked by the diffusion barrier 119,preventing the first dopants diffuse in to the second set of fins 200.In some embodiments, spike anneal at 1000 degrees Celsius and a durationof 1 second, dopant concentration higher than 1E19/cm³ can be measuredat 25 nm below the interface of the fin and the dopant layer by asecondary ion mass spectrometry (SIMS) measurement. Similarly, spikeanneal at 1000 degrees Celsius and duration of 10 seconds, dopantconcentration higher than 1E19/cm³ can be measured at 60 nm below theinterface. The capping layer 129 formed in FIG. 16 can be used as arobust shield to prevent the first dopant layer 109 from volatilizationunder the annealing operation.

In some embodiments, an average semiconductor fin width W is about 10 nmto 15 nm, the diffusion profile after spike anneal can effectively coverthe width W of the semiconductor fin, and hence, as shown in FIG. 18,the dopant concentration at the top region 1011 and the sidewall regions1013 of the first set of fins 100 are substantially identical.Furthermore, the dopant concentration at the cross section of the firstset of fins 100 shows an invert U shape contour (not shown) along thetop surface 101A and sidewalls 101B of the first set of fins 100.

In FIG. 18, a cover layer 300 can be formed over the first set and thesecond set of fins. In some embodiments where only the junction portionof an n-type fin is intended to be doped, the cover layer 300 can be asidewall spacer as discussed previously in FIGS. 1-11. In otherembodiments, when the junction portions of both an n-type fin and ap-type fin are intended to be doped, the cover layer 300 can be aphotoresist. FIG. 19 to FIG. 22 show operations to further dope thep-type fins after the doping of the n-type fins. It is understood thatan n-type LDD doping or a p-type LDD doping can be carried outindependently using the above described operations or equivalentmeasures. The sequence of conducting the n-type LDD doping and thep-type LDD doping is not a limitation provided in the presentdisclosure.

In FIG. 19, a photoresist 1900 is patterned and the diffusion barrier119, the first dopant layer 109, the capping layer 129 are removed bysuitable etching operations to expose the second set of fins 200. Afterthe removal of the photoresist 1900, in FIG. 20, a second dopant layer209 is deposited over the second set of fins 200 in a similar conditionas previously described in FIG. 15. The second dopant layer 209 containsdopants of a second type such as boron. BSG or boron-doped oxides can beused to from the second dopant layer 209. In some embodiments, theannealing operation can be conducted before or after the deposition ofthe second dopant layer 209. As shown in FIG. 21, an optional cappinglayer 219 is formed over the second dopant layer 209 as previouslydescribed in FIG. 16, followed by an annealing operation. The seconddopants in the second dopant layer 219 and the first dopants in thefirst dopant layer 109 diffuse into the second set of fins 200 and thefirst set of fins 100, respectively. In FIG. 22, a sidewall spacer 104is formed to cover all fins. Second dopant concentration at the topregion 2011 and sidewall region 2013 of the second set of fins 200 aresubstantially identical. In the same device, first dopant concentrationat the top region 1011 and sidewall region 1013 of the first set of fins100 are substantially identical.

FIG. 23 to FIG. 29 are fragmental cross sectional views along line BB ofFIG. 1, showing operations after the formation of the first dopant layer109 over the junction portion 107 of a first fin 103. In FIG. 23, anoptional oxide layer 106 is formed under the replacement gate 105′ andover the first fin 103. In some embodiments, the optional oxide layer isblanket deposited after the semiconductor fins are formed, for example,in the I/O region of a device. The first dopant layer 109 and cappinglayer 129 are subsequently formed conformally over the junction portion107 and the replacement gate 105′. In FIG. 24, sidewall spacer 104 isformed to cover at least the junction portion 107 and thus the firstdopant layer 109. Other dielectric layer is further formed to surroundthe sidewall spacer 104 but is not shown in FIG. 24 for purpose ofsimplicity. In FIG. 25, regrown source 301 and regrown drain 303 areformed in the first fin 103, abutting the sidewall spacer 104. In someembodiments, the regrown source and drain is formed by depositingsuitable materials in recesses (not shown) preformed in the first fin103. The first fin 103 is exposed to a pulse of phosphorous-containing,carbon-containing, and silicon-containing source vapors to deposit anepitaxial material in the recesses. In some embodiments, the pulsefurther comprises a carbon-containing source vapor and asilicon-containing source vapor. In some embodiments, thephosphorous-containing source vapor containing PH₃ further having a flowrate of between approximately 260 sccm and approximately 310 sccm. Insome embodiments, the carbon-containing source vapor containingmonomethyl silane (MMS) further having a flow rate of betweenapproximately 132 sccm and approximately 120 sccm. In some embodiments,the silicon-containing source vapor containing SiH₄ or Si₃H₈ having aflow rate of approximately 190 sccm. In some embodiments, the epitaxialmaterial has a phosphorous concentration between approximately 2E21/cm³and approximately 5E21/cm³, configured to produce a tensile strainwithin the channel.

In FIG. 26, a planarization operation such as a chemical mechanicalpolishing operation is carried out to remove a portion of the sidewallspacer 104 and the first dopant layer 109, and thus the replacement gate105′ is exposed. FIG. 27 shows the removal of the replacement gate 105′by an etching operation, for example, a dry etch operation. The firstdopant layer 109 may be partially removed during the dry etch operation.Subsequently, a wet etch operation is conducted as shown in FIG. 28.Both the capping layer 129 and the remaining first dopant layer 109 canbe removed in the wet etch operation. The oxide layer 106 is removedusing suitable etching operation.

Referring to FIG. 29, a metal gate 105 is formed by multi-layerdeposition to fill the trench resulting from the removal of thereplacement gate 105′. In some embodiments, a high-k dielectric layer106′ is formed before the deposition of the metal gate 105. Top surfaceof the metal gate further undergoes planarization operation.

Some embodiments of the present disclosure provide a FinFET structure,including a plurality of fins, a gate, and a first dopant layer. Thegate is disposed substantially orthogonal over the plurality of fins,covering a portion of a top surface and a portion of sidewalls of theplurality of fins. The first dopant layer covers the top surface and thesidewalls of a junction portion of a first fin, configured to providedopants of a first conductive type to the junction portion of the firstfin. The junction portion is adjacent to the gate.

In some embodiments, the FinFET structure further includes a sidewallspacer covering the first dopant layer over the junction portion.

In some embodiments, the FinFET structure further includes a seconddopant layer covering a top surface and sidewalls of the junctionportion of a second fin, configured to provide dopants of a secondconductive type to the junction portion of the second fin.

In some embodiments, the FinFET structure further includes a bi-layercovering a top surface and sidewalls of the junction portion of a secondfin. The bi-layer includes a first dopant layer and a diffusion barrierlayer.

In some embodiments, the first dopant layer includes borosilicate glass(BSG), phosphosilicate glass (PSG), borophosphosilicate glasses (BPSG),or the combinations thereof.

In some embodiments, a first dopant concentration in the first fin isuniformly distributed in proximity to the top surface and the sidewallsof the first fin.

In some embodiments, a thickness of the first dopant layer is in a rangeof from about 2 nm to about 8 nm.

Some embodiments of the present disclosure provides a MOS structure,including a first semiconductor fin and a metal gate covering a channelof the MOS structure. The first semiconductor fin includes a regrownregion and a lightly doped region. The lightly doped region is betweenthe regrown region and the metal gate. A first dopant concentration inproximity to a top surface of the lightly doped region is substantiallythe same as the first dopant concentration in proximity to a bottomsidewall of the lightly doped region.

In some embodiments, a difference between the first dopant concentrationin proximity to the top surface of the lightly doped region and thefirst dopant concentration in proximity to the sidewall of the lightlydoped region is below about 5%.

In some embodiments, the top surface and the sidewall of the lightlydoped region are covered by a first dopant layer configured to providethe lightly doped region with dopants of a first conductive type.

In some embodiments, the dopant layer includes BSG, PSG, BPSG, or thecombinations thereof.

In some embodiments, a thickness of the first dopant layer is in a rangeof from about 1 nm to about 8 nm.

In some embodiments, the MOS structure further includes a secondsemiconductor fin having a lightly doped region between a regrown regionand the metal gate. A second dopant concentration in proximity to a topsurface of the lightly doped region is substantially the same as thesecond dopant concentration in proximity to a bottom sidewall of thelightly doped region.

In some embodiments, a difference between the second dopantconcentration in proximity to the top surface of the lightly dopedregion and the second dopant concentration in proximity to the sidewallof the lightly doped region is below about 5%.

Some embodiments of the present disclosure provides a method formanufacturing a FinFET structure, including (1) forming a plurality ofsemiconductor fins; (2) forming a diffusion barrier over a top surfaceand a sidewall of a first set of a plurality of semiconductor fins; (3)forming a first dopant layer over a top surface and a sidewall of asecond set of the plurality of semiconductor fins, the first dopantlayer including dopants of a first conductive type; (4) diffusing thedopants of the first conductive type into the second set of theplurality of semiconductor fins by an annealing operation. The dopantconcentration of the dopants of the first conductive type in proximityto the top surface is controlled to be substantially identical to thedopant concentration of the dopants of the first conductive type inproximity to a bottom sidewall of the second set of the plurality of thesemiconductor fins.

In some embodiments, the forming the first dopant layer includes formingdoped oxide layer having a thickness in a range of from about 3 nm toabout 5 nm by an atomic layer deposition (ALD) operation.

In some embodiments, the forming the capping layer includes forming anitride layer having a thickness in a range of from about 8 nm to about12 nm by an ALD operation.

In some embodiments, the annealing operation includes duration of fromabout 1.5 second to about 10 seconds at a temperature range of fromabout 950 degrees Celsius to about 1050 degrees Celsius.

In some embodiments, the method further includes removing the diffusionbarrier layer from the first set of the plurality of the semiconductorfins by an etching operation.

The foregoing outlines features of several embodiments so that thoseskilled in the art may better understand the aspects of the presentdisclosure. Those skilled in the art should appreciate that they mayreadily use the present disclosure as a basis for designing or modifyingother processes and structures for carrying out the same purposes and/orachieving the same advantages of the embodiments introduced herein.Those skilled in the art should also realize that such equivalentconstructions do not depart from the spirit and scope of the presentdisclosure, and that they may make various changes, substitutions, andalterations herein without departing from the spirit and scope of thepresent disclosure.

1. A FinFET structure, comprising: a plurality of fins; a gate, disposedsubstantially orthogonal over the plurality of fins, covering a portionof a top surface and a portion of sidewalls of the plurality of fins; afirst dopant layer, covering the top surface and the sidewalls of ajunction portion of a first fin, configured to provide dopants of afirst conductive type to the junction portion of the first fin, whereinthe junction portion is adjacent to the gate, and a sidewall spacer,covering the first dopant layer over the junction portion.
 2. (canceled)3. The FinFET structure of claim 1, further comprising a second dopantlayer, covering a top surface and sidewalls of the junction portion of asecond fin, configured to provide dopants of a second conductive type tothe junction portion of the second fin.
 4. The FinFET structure of claim1, further comprising a bi-layer, covering a top surface and sidewallsof the junction portion of a second fin, wherein the bi-layer comprisesa first dopant layer and a diffusion barrier layer.
 5. The FinFETstructure of claim 1, wherein the first dopant layer comprisesborosilicate glass (BSG), phosphosilicate glass (PSG),borophosphosilicate glasses (BPSG), or the combinations thereof.
 6. TheFinFET structure of claim 1, wherein a first dopant concentration in thefirst fin is uniformly distributed in proximity to the top surface andthe sidewalls of the first fin.
 7. The FinFET structure of claim 1,wherein a thickness of the first dopant layer is in a range of fromabout 1 nm to about 8 nm.
 8. A MOS structure, comprising: a firstsemiconductor fin; and a metal gate covering a channel of the MOSstructure, wherein the first semiconductor fin comprises: a regrownregion; and a lightly doped region between the regrown region and themetal gate, wherein a first dopant concentration in proximity to a topsurface of the lightly doped region is substantially the same as thefirst dopant concentration in proximity to a bottom sidewall of thelightly doped region.
 9. The MOS structure of claim 8, wherein adifference between the first dopant concentration in proximity to thetop surface of the lightly doped region and the first dopantconcentration in proximity to the sidewall of the lightly doped regionis below about 5%.
 10. The MOS structure of claim 8, wherein the topsurface and the sidewall of the lightly doped region are covered by afirst dopant layer configured to provide the lightly doped region withdopants of a first conductive type.
 11. The MOS structure of claim 10,wherein the dopant layer comprises BSG, PSG, BPSG, or the combinationsthereof.
 12. The MOS structure of claim 10, wherein a thickness of thefirst dopant layer is in a range of from about 1 nm to about 8 nm. 13.The MOS structure of claim 8, further comprising a second semiconductorfin having a lightly doped region between a regrown region and the metalgate, wherein a second dopant concentration in proximity to a topsurface of the lightly doped region is substantially the same as thesecond dopant concentration in proximity to a bottom sidewall of thelightly doped region.
 14. The MOS structure of claim 13, wherein adifference between the second dopant concentration in proximity to thetop surface of the lightly doped region and the second dopantconcentration in proximity to the sidewall of the lightly doped regionis below about 5%.
 15. (canceled)
 16. (canceled)
 17. (canceled) 18.(canceled)
 19. (canceled)
 20. (canceled)
 21. A non-planar FET structure,comprising a semiconductor fin; a gate over the semiconductor fin; asource at least partially in the semiconductor fin and disposed at onesides of the gate; a sidewall spacer over the semiconductor fin, spacingthe gate and the source; and a dopant layer on a top surface of thesemiconductor fin, laterally abutting the gate and being encapsulated bythe sidewall spacer.
 22. The non-planar FET structure of claim 21,wherein the gate is a metal gate.
 23. The non-planar FET structure ofclaim 21, wherein the dopant layer comprises borosilicate glass (BSG),phosphosilicate glass (PSG), borophosphosilicate glasses (BPSG), or thecombinations thereof.
 24. The non-planar FET structure of claim 21,wherein the sidewall spacer is composed of nitride materials.
 25. Thenon-planar FET structure of claim 21, further comprising a capping layerover the dopant layer, the capping layer being encapsulated by thesidewall spacer.
 26. The non-planar FET structure of claim 21, whereinthe dopant layer is not in contact with the source.
 27. The FinFETstructure of claim 6, wherein a difference between the first dopantconcentration in proximity to the top surface of the junction portionand the first dopant concentration in proximity to the sidewall of thejunction portion is below about 5%.